Semiconductor Test Probes
With advanced manufacturing techniques and a dedication to precision
we provide semiconductor test probes that meet the high standards across diverse industries.
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I Highest application range: –55°C to 180°C
I High frequencies up to 100 GHz
I User-friendly maintenance & repair
I Maximum performance plus maximum operating time
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Semiconductor Test Probes Product Detail
Our Contact Probes are also used in Wafer Testing. They ensure precise contact from inside the test head of a Probe Card to maximize your throughput.
We provide a wide range of Contact Probes for testing. These Contact Probes are used in sockets where semiconductor chips undergo various tests. Discover precision in the smallest dimensions.
Sensors are extremely small components, which is why small pitches are a fundamental requirement. Achieve reliable testing of these sensors with our portfolio of Contact Probes. Just click below to browse our portfolio.
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Selection Guide of Semiconductor Test Probes
| ----------Product image---------- | Current Rating | Rated Resistance | Full Stroke | Rated Stroke | Spring Force | Bandwidth | Mechanical Life Exceeds | PDF Download | |
|---|---|---|---|---|---|---|---|---|---|
| DP020-xx-57-0.3GG(SS) |
|
0.5A | 100 milliohm max | 1.10mm | 0.65mm | 8±2gf@load 0.65mm(0.3oz) | -1dB@6.7GHZ | 100000 cycles |
|
| DP021-xx-57-0.3GG(SS) |
|
0.5A | 100 milliohm max | 1.10mm | 0.65mm | 8±2gf@load 0.65mm(0.3oz) | -1dB@6.7GHZ | 100000 cycles |
|
| DP026-xx-57-0.5GG(SS) |
|
0.5A | 100 milliohm max | 1.10mm | 0.65mm | 14±3gf@load 0.65mm(0.5oz) | -1dB@6.2GHZ | 100000 cycles |
|
| DP028-xx-57-0.6GG(SS) |
|
1A | 100 milliohm max | 1.10mm | 0.7mm | 20±5gf@load 0.7mm(0.6oz) | -1dB@6.8GHZ | 100000 cycles |
|
| DP030-xx-57-0.35GG(SS) |
|
1A | 100 milliohm max | 1.10mm | 0.65mm | 10±5gf@load 0.65mm(0.35oz) | -1dB@6.5GHZ | 100000 cycles |
|
| DP031-xx-57-0.7GG(SS) |
|
1A | 100 milliohm max | 1.10mm | 0.65mm | 20±5gf@load 0.65mm(0.7oz) | -1dB@6.8GHZ | 100000 cycles |
|
| DP035-xx-57-0.85GG(BB) |
|
1A | 100 milliohm max | 1.10mm | 0.65mm | 24±5gf@load 0.65mm(0.85oz) | -1dB@7.2GHZ | 100000 cycles |
|
| DP035-xx-86-0.8GG(BB) |
|
1A | 100 milliohm max | 1.30mm | 0.8mm | 23±5gf@load 0.80mm(0.8oz) | -1dB@8.2GHZ | 100000 cycles |
|
| DP038-xx-57-0.4GG(BB) |
|
1A | 100 milliohm max | 1.10mm | 0.65mm | 11±3gf@load 0.65mm(0.4oz) | -1dB@7.1GHZ | 100000 cycles |
|
| DP038-xx-57-1.1GG(BB) |
|
1A | 100 milliohm max | 1.10mm | 0.65mm | 30±6gf@load 0.65mm(1.1oz) | -1dB@7.8GHZ | 100000 cycles |
|
| DP038-xx-63-0.85GG(BB) |
|
1A | 100 milliohm max | 1.10mm | 0.80mm | 24±5gf@load 0.80mm(0.85oz) | -1dB@7.1GHZ | 100000 cycles |
|
| DP051-xx-57-0.7GG(BB) |
|
1A | 100 milliohm max | 1.10mm | 0.65mm | 20±5gf@load 0.65mm(0.7oz) | -1dB@7.5GHZ | 100000 cycles |
|
| DP051-xx-61-1.2GG(BB) |
|
1A | 100 milliohm max | 1.30mm | 0.95mm | 34±8gf@load 0.95mm(1.2oz) | -1dB@7.3GHZ | 100000 cycles |
|
| DP051-xx-63-0.7GG(BB) |
|
1A | 100 milliohm max | 1.50mm | 1.00mm | 20±4gf@load 1.00mm(0.7oz) | -1dB@7.3GHZ | 100000 cycles |
|
| DP057-xx-31-1.1GG(BB) |
|
2A | 100 milliohm max | 0.60mm | 0.48mm | 30±6gf@load 0.48mm(1.1oz) | -1dB@8.7GHZ | 100000 cycles |
|
| DP058-xx-57-1.1GG(BB) |
|
2A | 100 milliohm max | 1.10mm | 0.65mm | 30±5gf@load 0.65mm(1.1oz) | -1dB@8.5GHZ | 100000 cycles |
|
| DP058-xx-63-1.1GG(BB) |
|
2A | 100 milliohm max | 1.30mm | 0.85mm | 30±6gf@load 0.85mm(1.1oz) | -1dB@8.8GHZ | 100000 cycles |
|
| DP078-xx-57-0.9GG(BB) |
|
2A | 100 milliohm max | 1.50mm | 0.80mm | 26±5gf@load 0.80mm(0.9oz) | -1dB@10.2GHZ | 100000 cycles |
|
| DP078-xx-63-1.2GG(BB) |
|
2A | 100 milliohm max | 1.50mm | 0.80mm | 35±7gf@load 0.80mm(1.2oz) | -1dB@10.2GHZ | 100000 cycles |
|
| DP085-xx-57-1.1GG(BB) |
|
2A | 50 milliohm max | 1.10mm | 0.65mm | 30±6gf@load 0.65mm(1.1oz) | -1dB@11.5GHZ | 100000 cycles |
|
| DP100-xx-131-3.5GG(BB) |
|
2A | 50 milliohm max | 3.10mm | 2.00mm | 100±30gf@load 2.00mm(3.5oz) | -1dB@13.5GHZ | 100000 cycles |
|
| DQ031-xx-33-0.9GG(BB) |
|
1A | 100 milliohm max | 0.55mm | 0.45mm | 26±5gf@load 0.45mm(0.9oz) | -1dB@13.0GHZ | 100000 cycles |
|
| DE058-xx-88-1.2GG(BB) |
|
2A | 100 milliohm max | 1.20mm | 0.80mm | 35±7gf@load 0.80mm(1.2oz) | -1dB@12.0GHZ | 100000 cycles |
|
| DE078-xx-88-1.2GG(BB) |
|
2A | 100 milliohm max | 1.50mm | 1.00mm | 35±7gf@load 1.00mm(1.2oz) | -1dB@6.0GHZ | 100000 cycles |
|
| HDE065-xx-113-1.6GG(BB) |
|
2A | 100 milliohm max | 1.70mm | 1.10mm | 45±9gf@load 1.10mm(1.6oz) | -1dB@10.3GHZ | 100000 cycles |
|
| HDE052-xx-63-0.7GG(BB) |
|
1A | 100 milliohm max | 1.50mm | 1.00mm | 20±4gf@load 1.00mm(0.7oz) | -1dB@6.0GHZ | 100000 cycles |
|
Semiconductor Test Probes Solutions
Our products guarantee ultimate quality in Semiconductor production.
Our cutting-edge, custom testing technologies serve as solutions for numerous applications
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